15747
Silicon Standard for ICP
TraceCERT®, 1 g/L Si in NaOH (nominal concentration)
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About This Item
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grade
certified reference material
TraceCERT®
Quality Level
product line
TraceCERT®
concentration
1 g/L Si in NaOH (nominal concentration)
technique(s)
ICP: suitable
format
single component solution
Related Categories
General description
This certified reference material (CRM) is produced in accordance with ISO 17034 and characterized in accordance with ISO/IEC 17025. This CRM is traceable to SI unit kg and measured against primary material from a National Metrology Institute (NMI), e.g. NIST.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.
Please visit ISO certificates and Site Quality Self-Assessments to access the current certificates of accreditation.
Download your certificate at http://www.sigma-aldrich.com to view certified values, including uncertainty, date of expiry, and detailed information about trace impurities.
Application
50 ng/g of Silicon standard may be used to improve maximum signal-to-background intensity ratios (SBR) during High-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS).
Analysis Note
1 g/L Si in 2% sodium hydroxide, prepared with high purity Si, NaOH and water
Other Notes
For a complete product listing of our TraceCERT® range of CRMs for ICP and AAS, technical information, and example certificates please visit our ICP & AAS standards website
Legal Information
TraceCERT is a registered trademark of Merck KGaA, Darmstadt, Germany
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Danger
hcodes
Hazard Classifications
Eye Dam. 1 - Met. Corr. 1 - Skin Corr. 1B
Storage Class
8B - Non-combustible, corrosive hazardous materials
wgk_germany
nwg
flash_point_f
Not applicable
flash_point_c
Not applicable
ppe
Faceshields, Gloves, Goggles, type ABEK (EN14387) respirator filter
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